1MV VEGA Accelerator
The 1MV accelerator system, named VEGA, is designed with the capability to perform high efficiency, high precision 14C and actinide mass spectrometry.
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The 1MV accelerator system, named VEGA, is designed with the capability to perform high efficiency, high precision 14C and actinide mass spectrometry.
The Centre for Accelerator Science operates four ion accelerators with 11 on sources and 13 beamlines
Detailed data on ANSTO electricity use and CO2 emissions for FY2022 - FY2023
ANSTO plays a leading role in measuring and characterising fine particles from a range of locations around Australia and internationally.
Dr Klaus Wilcken is an accelerator mass spectrometry scientist at the Centre for Accelerator Science (CAS) with over 12 years of experience with suite of AMS isotopes & techniques.
Particle induced X-ray emission can be used for quantitative analysis in archaeology, geology, biology, materials science and environmental pollution.
Particle Induced X-ray Emission (PIXE) is a powerful and relatively simple analytical technique that can be used to identify and quantify trace elements typically ranging from aluminium to to uranium.
Cosmogenic nuclides measurements at ANSTO to be part of large international Antarctic glacier research.
A new source added to ANSTO’s cosmogenic toolkit to study past climate and landscape change
Role at ANSTO
ANSTO is participating in a major project to learn more about an important component of the atmosphere, the hydroxyl radical.
The high-energy heavy ion microprobe is used for the characterisation or modification of material properties at depths from approximately 1 micrometre to maximum depths of up to 500 micrometres from the material surface.
Read about an ANSTO scientist and their work to prepare for a school project or interview.
Phenomenon predicted by Nobel Prize recipient
Role at ANSTO
The high-energy heavy-ion microprobe is used for the characterisation or modification of material properties at depths from approximately 1 micrometre to maximum depths of up to 500 micrometres from the material surface.