Dr Zeljko Pastuovic
Role at ANSTO
Zeljko's responsibilities lie primarily in contributions to the $37 M worth Centre for Accelerator Science (CAS) Project, including design, construction and installation of the 4 new beamliness for Ion Bean Analysis (IBA) of the new 6 MV NEC Pelletron accelerator commissioned by the ANSTO. Interdisciplinary scientific research in the areas of the radiation dosimetry, ion beam modification of materials, and applied nuclear methods for microscopy, mapping and characterisation with the ANTARES Heavy Ion Microprobe.
Ion Beam Analysis (IBA) instrumentation, in particular (Heavy-) Ion Microprobe and; Ion beam interactions with matter, ion beam induced material modification and material characterisation with IBA techniques, in particular semiconductor materials and devices.
Qualifications & Achievements
- Publication of 31 refereed research articles in international journals.
- Ph.D. in Condensed Matter Physics, University of Zagreb (2009)
- M.Sc. in Applied Nuclear Physics, University of Zagreb (2004)
I. Zamboni, Z. Pastuovic, M. Jaksic, Radiation hardness of a single crystal CVD diamond detector tested with MeV energy ions, accepted for publication in Diamond&Related Materials (2012)
Pastuovic, E. Vittone, I. Capan, M. Jaksic, Probability of divacancy trap production in silicon diodes exposed to focused ion beam irradiation, Appl. Phys. Lett., Vol.98, Issue 9, 092101, 2011
P. Olivero, J. Forneris, M. Jaksic, Pastuovic, F. Picollo, N. Skukan, E. Vittone, Focused ion beam fabrication and IBIC characterization of a diamond detector with buried electrodes, Nucl. Instr. and Meth. in Phys. Res. B, Vol. 269, pp. 2340-2344,2011
P. Olivero, G. Amato, F. Bellotti, O. Budnyk, E. Colombo, M. Jakic, C. Manfredotti, Pastuovic, F. Picollo, N. Skukan, M. Vannoni, E. Vittone, Direct fabrication of three-dimensional buried conductive channels in single crystal diamond with ion microbeam induced graphitization, Diamond&Related Materials, Vol.18, pp.870-876, 2009
E. Vittone, Pastuovic, P. Olivero, C. Manfredotti, M. Jakic, A. LoGiudice, F. Fizzotti, E. Colombo: Semiconductor Characterisation by scanning ion beam induced charge (IBIC) microscopy, Nucl. Instr. and Meth. in Phys. Res. B, Vol. 266, Issues 8, pp. 1312-1318, 2008
M. Jakic, Bonjak, D. Gracin, Z. Medunic, Pastuovic, E. Vittone and F. Nava: Characterisation of SiC by IBIC and other IBA techiques, Nucl. Instr. and Meth. in Phys. Res. B, Vol. 188, Issues 1-4, pp. 130-134, 2002