Dr Garry Foran
Australian Synchrotron Research Program
Phone (Japan) +81 29 864 7959
Phone (Australia) +61 2 9717 9754
E-Mail foran@anbf2.kek.jp
Dr. Garry Foran joined ANSTO in 1992 as a beamline scientist working at the Australian National Beamline Facility in Tsukuba, Japan. He is now seconded to the Australian Synchrotron in Melbourne.
Garry is a synchrotron-radiation specialist with experience at facilities in Europe, the USA and Japan. At the Australian National Beamline Facility he takes direct responsibility for the X-ray Absorption Spectroscopy capability and is an Australian authority in this field.
Research interests include applications of X-ray Absorption Spectroscopy to bioinorganic chemistry and the study of amorphous semiconductor and nano-scale materials. In addition, Garry has a longstanding research collaboration using synchrotron X-ray reflectometry, grazing-incidence diffraction and X-ray Absorption Spectroscopy in the structural characterisation of organic thin films and two-dimensional molecular networks..
Garry is an Adjunct Associate Professor in Chemistry at the University of Sydney
Selected Recent Papers
A. Levina, G. J. Foran, D. I. Pattison, and P. A. Lay, X-ray absorption spectroscopic and electrochemical studies of tris(catecholato (2-))chromate (V/I V/III) complexes, Angewandte Chemie-International Edition 43, 462-465 (2004).
A. Levina, R. Codd, G. J. Foran, T. W. Hambley, T. Maschmeyer, A. F. Masters, and P. A. Lay, X-ray absorption spectroscopic studies of chromium(V/IV/III)2-ethyl-2-hydroxybutanoato(2-/1-) complexes, Inorganic Chemistry 43, 1046-1055 (2004).
M. D. Hall, G. J. Foran, M. Zhang, P. J. Beale, and T. W. Hambley, XANES determination of the platinum oxidation state distribution in cancer cells treated with platinum(IV) anticancer agents, Journal of the American Chemical Society 125, 7524-7525 (2003).
C. J. Glover, G. J. Foran, and M. C. Ridgway, Structure of amorphous silicon investigated by EXAFS, Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms 199, 195-199 (2003).
S. A. Holt, G. J. Foran, and J. W. White, Observation of hexagonal crystalline diffraction from growing silicate films, Langmuir 15, 2540-2542 (1999).