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Technical Information - X-ray fluorescence microscopy
X-ray fluorescence microscopy

Technical Information - XFM beamline

The beamline has two probes optimised for studies at length-scales spanning 2 orders of magnitude.  A milliprobe has a resolution of around 100 µm and a Kirkpatrick-Baez (KB) mirror microprobe is optimised for applications requiring high flux at the micron length scale. These systems can be used to obtain maps of elemental distribution and for a range of spectroscopic applications such as determining oxidation state and speciation.

Beamline Properties

Source

In-Vacuum Undulator
n = 90 periods, 22 mm length

Monochromation Si DCM, <1,1,1> OR <3,1,1> reflection
Energy Range 4.1 - 27 keV
Energy Resolution ΔE/E ~ 10-4

 

Typical probe performance (10 keV)
Focusing method milliprobe microprobe  
Resolution[µm] 50 - 200 1 - 5  
Scan range [mm * mm] 600 * 1200 140 * 100  
Flux @ coarsest resolution [ph/s] 1012 4 . 1011  
Flux density [ph/s/µm2] 106 1010  

 

Detector characteristics
Type Vortex EM-90 Maia Rev C or D
Geometry 90-degree

180-degree
(Backscatter)

Minimum Energy 1.6 keV 2.0 keV
Solid Angle 0.1 sr 1.1 sr
Peak count rate 500 kHz 1.4 MHz
Energy Resolution [eV] 120 275

 

XFM dialogue