Skip to main content
Search hero banner

Search results

Showing 241 - 260 of 594 results

PIXE Microbeam on Sirius

Particle Induced X-ray Emission

Particle Induced X-ray Emission (PIXE) is a powerful and relatively simple analytical technique that can be used to identify and quantify trace elements typically ranging from aluminium to to uranium.

Sirius accelerator

Ion beam analysis techniques

When an energetic ion beam hits a sample it will interact with the atoms through a number of very complex interactions. By detecting and measuring the reaction products resulting from the various interactions and their intensities, you can obtain quantitative data on the sample's constituent elements and their spatial distribution.

ANSTO reports

Report to the independent nuclear regulator, ARPANSA, and the IAEA

FLEET appointment

Instrument scientist and expert in low dimensional magnetism Dr Kirrily Rule joins FLEET ARC Centre.

It's all about the interface with multi-use polymer brushes

The University of Newcastle and UNSW [GW1] are using advanced neutron scattering techniques at ANSTO to carry out research on the structure of polymers in complex salt environments that will ultimately provide a way to predict their behaviour for real-world applications.

Pagination