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PIXE Microbeam on Sirius

Particle Induced X-ray Emission

Particle Induced X-ray Emission (PIXE) is a powerful and relatively simple analytical technique that can be used to identify and quantify trace elements typically ranging from aluminium to to uranium.

Sirius accelerator

Ion beam analysis techniques

When an energetic ion beam hits a sample it will interact with the atoms through a number of very complex interactions. By detecting and measuring the reaction products resulting from the various interactions and their intensities, you can obtain quantitative data on the sample's constituent elements and their spatial distribution.

ANSTO reports

Report to the independent nuclear regulator, ARPANSA, and the IAEA

FLEET appointment

Instrument scientist and expert in low dimensional magnetism Dr Kirrily Rule joins FLEET ARC Centre.

Pagination