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Innovative cancer research

An ANSTO radiochemist has been awarded a scholarship to carry out research at the world-renowned Sloan Kettering Cancer Center in New York.

Far Infrared beamline

THz - Far Infrared

The THz/Far-IR Beamline couples the high brightness and collimation of a bend-magnet synchrotron radiation to a Bruker IFS125HR spectrometer providing high-resolution spectra (0.00096 cm-1) with signal to noise ratio superior to that of thermal sources up to 1350 cm-1 for gas-phase applications; the beamline also delivers signal to noise ratio superior to that of thermal sources up to 350 cm-1 for condensed phase samples.

Surfer Plot

Data Analysis

Below lists some useful programs for data reduction, search matching, analysis and structure visualisation of diffraction data.

ANSTO Hosted IAEA Pacific Islands Workshop in February 2024

In early February, ANSTO was honoured to host the International Atomic Energy Agency (IAEA) National Liaison Officers Meeting and Sub Regional Approach to the Pacific Islands (SAPI) Programme, which focused on the development and delivery of the IAEA Technical Cooperation Programme in the Pacific.

World Environment Day 2019. Beating air pollution

Today is World Environment Day, a United Nations initiative for encouraging worldwide awareness and action for the environment. This year’s theme is “Beat Air Pollution”, a call to action to combat this global crisis.

Window into the cell

Access to a ‘window into the cell’ with University of Wollongong cryogenic electron microscope at ANSTO.

Infrared microspectroscopy

Infrared microspectroscopy

The Infrared Microspectroscopy beamline combines the high brilliance and collimation of the synchrotron beam through a Bruker V80v Fourier Transform Infrared (FTIR) spectrometer and into a Hyperion 3000 IR microscope to reach high signal-to-noise ratios at diffraction limited spatial resolutions between 3-8 μm.

ANTARES microprobe

High-energy heavy ion microprobe

The high-energy heavy-ion microprobe is used for the characterisation or modification of material properties at depths from approximately 1 micrometre to maximum depths of up to 500 micrometres from the material surface. 

Pagination