Skip to main content
Search hero banner

Search results

Showing 81 - 100 of 132 results

PIXE Microbeam on Sirius

Particle Induced X-ray Emission

Particle Induced X-ray Emission (PIXE) is a powerful and relatively simple analytical technique that can be used to identify and quantify trace elements typically ranging from aluminium to to uranium.

Advanced materials

Stable, highly conductive 2D nanosheets of boron nitride promising new material.

Accelerator

Micro-Particle Induced X-ray Emission

Micro-Particle Induced X-ray Emission (µPIXE) is used to construct elemental maps that show variations of an element's concentration across the sample surface.

The characterisation of planetary materials

The characterisation of planetary materials

ANSTO provides a range of capabilities using neutrons, X-rays and infrared radiation to study the solids, liquids and gases that might be found in materials in our solar system and beyond.

hills on Mars

The characterisation of planetary materials

ANSTO provides a range of capabilities using neutrons, X-rays and infrared radiation to study the solids, liquids and gases that might be found in materials in our solar system and beyond.

Archaeology

PIXE

Particle induced X-ray emission can be used for quantitative analysis in archaeology, geology, biology, materials science and environmental pollution.

Pagination